Correlation spectrum analyzer for direct measurement of device current noise

Review of Scientific Instruments

Volumn 73, Issue 7, 2002, Pages 2717-

  Ferrari, Giorgio ^a   Sampietro, Marco ^a  

^a POLITECNICO DI MILANO   (Italy)

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Indexed keywords

EID: 0036639756     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1487891     Document Type: Article

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