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Volumn 79, Issue 13, 1997, Pages 2530-2533

Current-voltage characteristics of self-assembled monolayers by scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC DENSITY OF STATES; ELECTROSTATICS; MOLECULES; SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

EID: 0031221461     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.2530     Document Type: Article
Times cited : (727)

References (19)
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.