Physics of imaging p-n junctions by scanning tunneling microscopy and spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 16, 2003, Pages 1653071-1653078

  Jager N D ^a   Marso, M ^a   Salmeron, M ^b   Weber, E R ^b,c   Urban, K ^a   Ebert, Ph ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; ELECTRIC POTENTIAL; ENERGY; IMAGE ANALYSIS; IMAGING SYSTEM; PHYSICS; SCANNING TUNNELING MICROSCOPY; SCANNING TUNNELING SPECTROSCOPY; SEMICONDUCTOR; SIMULATION; SPECTROSCOPY;

EID: 0038320374     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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