SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 104, Issue 3-4, 2005, Pages 220-225

Focused ion beam-nanomachined probes for improved electric force microscopy

(4) Menozzi, Claudia a Carlo Gazzadi, Gian a Alessandrini, Andrea a Facci, Paolo a

a CNR Consiglio Nazionale delle Ricerche (Italy)

Author keywords

Atomic force microscopy; Electric force microscopy; Focused ion beam; Force volume

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; DEPOSITION; NANOTECHNOLOGY; OPTICAL RESOLVING POWER; PLATINUM; SILICON;

ELECTRIC FORCE MICROSCOPY; ELECTRO-SENSITIVITY; FOCUSED ION BEAMS (FIB); NANO-ELECTRODES;

ION BEAMS;

NANOPARTICLE;

ARTICLE; ATOMIC FORCE MICROSCOPY; COATED PARTICLE; CONTRAST ENHANCEMENT; ELECTRIC ACTIVITY; ELECTRIC CAPACITANCE; ION CONDUCTANCE; SCANNING PROBE MICROSCOPY;

EID: 22144452597 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/j.ultramic.2005.04.004 Document Type: Article

Times cited : (25)

References (15)

1
- 0000006242
- G. Binnig, and H. Rohrer Helv. Phys. Acta 55 1982 726
- (1982) Helv. Phys. Acta , vol.55 , pp. 726
- Binnig, G.¹ Rohrer, H.²

2
- 0012618901
- G. Binnig, C.F. Quate, and Ch. Gerber Phys. Rev. Lett. 56 1986 930
- (1986) Phys. Rev. Lett. , vol.56 , pp. 930
- Binnig, G.¹ Quate, C.F.² Gerber, Ch.³

3
- 0032594479
- M. Kageshima, H. Ogiso, S. Nakano, M.A. Lantz, and H. Tokumoto Jpn. J. Appl. Phys. 38 1999 3958
- (1999) Jpn. J. Appl. Phys. , vol.38 , pp. 3958
- Kageshima, M.¹ Ogiso, H.² Nakano, S.³ Lantz, M.A.⁴ Tokumoto, H.⁵

4
- 0001359535
- L. Folks, M.E. Best, P.M. Rice, B.D. Terris, D. Weller, and J.N. Chapman Appl. Phys. Lett. 76 2000 909
- (2000) Appl. Phys. Lett. , vol.76 , pp. 909
- Folks, L.¹ Best, M.E.² Rice, P.M.³ Terris, B.D.⁴ Weller, D.⁵ Chapman, J.N.⁶

5
- 0000055999
- J.A. Veerman, A.M. Otter, L. Kuipers, and N.F. van Hulst Appl. Phys. Lett. 72 1998 3115
- (1998) Appl. Phys. Lett. , vol.72 , pp. 3115
- Veerman, J.A.¹ Otter, A.M.² Kuipers, L.³ Van Hulst, N.F.⁴

6
- 79956057883
- A. Lugstein, E. Bertagnolli, C. Kranz, A. Kueng, and B. Mizaikoff Appl. Phys. Lett. 81 2002 349
- (2002) Appl. Phys. Lett. , vol.81 , pp. 349
- Lugstein, A.¹ Bertagnolli, E.² Kranz, C.³ Kueng, A.⁴ Mizaikoff, B.⁵

7
- 36549104784
- Y. Martin, D.W. Abraham, and H.K. Wickramasinghe Appl. Phys. Lett. 52 1988 1103
- (1988) Appl. Phys. Lett. , vol.52 , pp. 1103
- Martin, Y.¹ Abraham, D.W.² Wickramasinghe, H.K.³

8
- 33745604763
- M. Nonnenmacher, M.P. O'Boyle, and H.K. Wickramasinghe Appl. Phys. Lett. 58 1991 2921
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2921
- Nonnenmacher, M.¹ O'Boyle, M.P.² Wickramasinghe, H.K.³

9
- 0000645519
- S. Belaidi, P. Girard, and G. Leveque J. Appl. Phys. 81 1997 1023
- (1997) J. Appl. Phys. , vol.81 , pp. 1023
- Belaidi, S.¹ Girard, P.² Leveque, G.³

10
- 0001648770
- H.O. Jacobs, P. Leuchtmann, O.J. Homan, and A. Stemmer J. Appl. Phys. 84 1998 1168
- (1998) J. Appl. Phys. , vol.84 , pp. 1168
- Jacobs, H.O.¹ Leuchtmann, P.² Homan, O.J.³ Stemmer, A.⁴

11
- 0031247681
- S. Belaidi, P. Girard, and G. Leveque Microelectron. Reliab. 37 1997 1627
- (1997) Microelectron. Reliab. , vol.37 , pp. 1627
- Belaidi, S.¹ Girard, P.² Leveque, G.³

12
- 0032083827
- V. Wittpahl, U. Behnke, B. Wand, and W. Mertin Microelectron. Reliab. 38 1998 981
- (1998) Microelectron. Reliab. , vol.38 , pp. 981
- Wittpahl, V.¹ Behnke, U.² Wand, B.³ Mertin, W.⁴

13
- 18444412909
- X.D. Cui, X. Zarate, J. Tomfohr, A. Primak, A.L. Moore, T.A. Moore, D. Gust, G. Harris, O.F. Sankey, and S.M. Lindsay Ultramicroscopy 92 2002 67
- (2002) Ultramicroscopy , vol.92 , pp. 67
- Cui, X.D.¹ Zarate, X.² Tomfohr, J.³ Primak, A.⁴ Moore, A.L.⁵ Moore, T.A.⁶ Gust, D.⁷ Harris, G.⁸ Sankey, O.F.⁹ Lindsay, S.M.¹⁰

14
- 34347209835
- H.-J. Butt, and M. Jaschke Nanotechnology 6 1995 1
- (1995) Nanotechnology , vol.6 , pp. 1
- Butt, H.-J.¹ Jaschke, M.²

15
- 0028284764
- M. Radmacher, J.P. Cleveland, M. Fritz, H.G. Hansma, and P.K. Hansma Biophys. J. 66 1994 2159
- (1994) Biophys. J. , vol.66 , pp. 2159
- Radmacher, M.¹ Cleveland, J.P.² Fritz, M.³ Hansma, H.G.⁴ Hansma, P.K.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.