Reliability- and Process-variation aware design of integrated circuits - A broader perspective

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Alam, Muhammad A ^b   Roy, Kaushik ^b   Augustine, Charles ^a  

^a PURDUE UNIVERSITY   (United States)

^b NONE

Author keywords

circuit design; lifetime projection; modeling; positive reliability physics; variability

Indexed keywords

CIRCUIT DESIGNS; CORE AREA; ELECTRO-MECHANICAL; FAULT-TOLERANT; FUTURE TECHNOLOGIES; LIFETIME PROJECTION; NEW DIMENSIONS; PARAMETRIC DEGRADATION; POSITIVE RELIABILITY PHYSICS; PROCESS-VARIATION; RADIATION HARD DESIGN; REDUNDANCY TECHNIQUES; RELIABILITY AWARE DESIGN; RELIABILITY QUALIFICATION; SOFTWARE-BASED; THIN-FILM TECHNOLOGY; TRANSIENT ERRORS; VARIABILITY; VLSI DESIGN;

DESIGN; GATE DIELECTRICS; GATES (TRANSISTOR); INTEGRATED CIRCUIT MANUFACTURE; SOFTWARE RELIABILITY; VLSI CIRCUITS;

INTEGRATED CIRCUITS;

EID: 79959306535     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784500     Document Type: Conference Paper

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