Estimation of NBTI degradation using IDDQ measurement

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2007, Pages 10-16

  Kang, Kunhyuk ^a   Alam, Muhammad Ashraful ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

fMAX; IDDQ; NBTI; Temporal reliability

Indexed keywords

BIAS CURRENTS; CORRELATION METHODS; LEAKAGE CURRENTS; RELIABILITY; TEMPERATURE MEASUREMENT;

NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI); OPERATING FREQUENCY; TEMPORAL RELIABILITY;

CMOS INTEGRATED CIRCUITS;

EID: 34548742924     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2007.369861     Document Type: Conference Paper

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