An oil-die CMOS leakage current sensor for measuring process variation in sub-90nm generations

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue CIRCUITS SYMP., 2004, Pages 250-251

  Kim, Chris H ^a   Roy, Kaushik ^a   Hsu, Steven ^b   Krishnamurthy, Ram K ^b   Borkar, Shekhar ^b  

^a PURDUE UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COMPARATORS (OPTICAL); DIGITAL SIGNAL PROCESSING; ELECTRIC GENERATORS; FABRICATION; LEAKAGE CURRENTS; MICROPROCESSOR CHIPS; SENSORS; SIGNAL TO NOISE RATIO; THERMOMETERS; THRESHOLD VOLTAGE;

COMPARATORS; MULTI-BIT RESOLUTION SENSING; PROCESS VARIATION;

CMOS INTEGRATED CIRCUITS;

EID: 4544298463     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. C. H. Kim et al., 2003 VLSI Symp. Digest, pp. 205-206.
2. T. Kuroda et al., 1996 ISSCC Digest, pp. 166-167.
3. M. Griffin et al., 1998 IEEE JSSC, pp. 1741-1751
4. S. Thompson et al., 2002 IEDM Digest, pp. 61-64.
5. M. Steyaert et al., 1993 CICC, pp. 28.1.1-28.1.4