Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage

Digest of Technical Papers-IEEE International Solid-State Circuits Conference

Volumn , Issue , 2002, Pages

  Tschanz, James ^a   Kao, James ^b   Narendra, Siva ^a   Nair, Raj ^a   Antoniadis, Dimitri ^b   Chandrakasan, Anantha ^b   De, Vivek ^a  

^a INTEL CORPORATION   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

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EID: 85013300852     PISSN: 01936530     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISSCC.2002.992287     Document Type: Article

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