Compactor independent direct diagnosis

Proceedings of the Asian Test Symposium

Volumn , Issue , 2004, Pages 204-209

  Cheng, Wu Tung ^a   Tsai, Kun Han ^a   Huang, Yu ^a   Tamarapalli, Nagesh ^a   Rajski, Janusz ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT TRANSFORMATION; EMBEDDED COMPRESSION; FAILURE RESPONSE; SCAN CHAINS;

ALGORITHMS; BANDWIDTH; DATA REDUCTION; FAILURE ANALYSIS; INTEGRATED CIRCUITS; NETWORKS (CIRCUITS); PROBLEM SOLVING; VLSI CIRCUITS;

ELECTRIC FAULT CURRENTS;

EID: 13244249525     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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