Characterization and estimation of circuit reliability degradation under NBTI using on-line IDDQ measurement

Proceedings - Design Automation Conference

Volumn , Issue , 2007, Pages 358-363

  Kang, Kunhyuk ^a   Kim, Keejong ^a   Islam, Ahmad E ^a   Alam, Muhammad A ^a   Roy, Kaushik ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

IDDQ; NBTI; Reliability characterization

Indexed keywords

CIRCUIT SIMULATION; NANOTECHNOLOGY; RELIABILITY; SPURIOUS SIGNAL NOISE; STATIC RANDOM ACCESS STORAGE; THERMODYNAMIC STABILITY; TIMING CIRCUITS;

ANALYTICAL EXPRESSIONS; NBTI CHARACTERIZATION; RELIABILITY CHARACTERIZATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 34547377273     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2007.375187     Document Type: Conference Paper

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