Statistical design and optimization of SRAM cell for yield enhancement

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2004, Pages 10-13

  Mukhopadhyay, Saibal ^a   Mahmoodi, Hamid ^a   Roy, Kaushik ^a  

^a Purdue University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; CONTROLLABILITY; LAGRANGE MULTIPLIERS; MOSFET DEVICES; OPTIMIZATION; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; PROBLEM SOLVING; STATISTICAL METHODS; THRESHOLD VOLTAGE;

RANDOM DOPANT FLUCTUATION (RDF); SRAM CELLS; STATISTICAL DESIGN; YIELD ENHANCEMENT;

STATIC RANDOM ACCESS STORAGE;

EID: 16244384194     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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