Death, taxes and failing chips

Proceedings - Design Automation Conference

Volumn , Issue , 2003, Pages 343-347

  Visweswariah, Chandu ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Design methodology; Parametric yield prediction; Statistical timing

Indexed keywords

COMPUTER SIMULATION; PROBABILITY DISTRIBUTIONS; PRODUCT DESIGN;

STATISTICAL TIMING;

MICROPROCESSOR CHIPS;

EID: 0042635808     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/775919.775921     Document Type: Conference Paper

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