SEMM-2: A new generation of single-event-effect modeling tools

IBM Journal of Research and Development

Volumn 52, Issue 3, 2008, Pages 233-244

  Tang, Henry H K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; COMPUTER NETWORKS; ELECTRONICS INDUSTRY; INDUSTRY; INTEGRATED CIRCUITS; MICROELECTRONICS; MODAL ANALYSIS; PHOTOACOUSTIC EFFECT; SECONDARY EMISSION; TECHNOLOGY;

COMPLEX GEOMETRIES; CURRENT STATUS; GENERAL (CO); INTEGRATED CIRCUIT (IC) DESIGN; INTERNATIONAL BUSINESS; MATERIAL COMPOSITIONS; METAL-OXIDE SEMICONDUCTOR (MOS); MODELING TOOLS; MONTE CARLO MODELLING; NEW GENERATION; NUCLEAR PROCESSING; SEE ANALYSIS; SIMULATION PLATFORMS; SUB-ATOMIC PARTICLES; TRANSPORT PROBLEMS;

ERROR ANALYSIS;

EID: 45749119115     PISSN: 00188646     EISSN: 00188646     Source Type: Journal    
DOI: 10.1147/rd.523.0233     Document Type: Article

References (44)

1. "Terrestrial Cosmic Rays and Soft Errors," IBM J. Res. & Dev. 40, No. 1 (1996, entire issue).
2. G. R. Srinivasan, H. H. K. Tang, and P. C. Murley, "Parameter-Free, Predictive Modeling of Single Event Upsets Due to Protons, Neutrons, and Pions in Terrestrial Cosmic Rays," IEEE Trans. Nuel. Sci. 41, No. 6, 2063-2070 (1994).
3. G. R. Srinivasan, P. C. Murley, and H. K. Tang, "Accurate, Predictive Modeling of Soft Error Rate Due to Cosmic Rays and Chip Alpha Radiation," IEEE 32nd Annual Proceedings, Reliability Physics Symposium, 1994, pp. 12-16.
4. P. C. Murley and G. R. Srinivasan, "Soft-Error Monte Carlo Modeling Program, SEMM," IBM J. Res. & Dev. 40, No. 1, 109-118 (1996).
5. H. H. K. Tang, "Nuclear Physics of Cosmic Ray Interaction with Semiconductor Materials: Particle-Induced Soft Errors from a Physicist's Perspective," IBM J. Res. & Dev. 40, No. 1, 91-108 (1996).
6. H. H. K. Tang, G. R. Srinivasan, and N. Azziz, "Cascade Statistical Model for Nucleon-Induced Reactions on Light Nuclei in the Energy Range 50 MeV-1 GeV," Phys. Rev. C 42, No. 4, 1598-1622 (1990).
7. N. Azziz, H. H. K. Tang, and G. R. Srinivasan, "A Microscopic Model of Energy Deposition in Silicon Slabs Exposed to High-Energy Protons," J. Appl. Phys. 62, No. 2, 414-418 (1987).
8. M. S. Gordon, K. P. Rodbell, D. F. Heidel, C. Cabral, Jr., E. H. Cannon, and D. D. Reinhardt, "Single-Event-Upset and Alpha-Particle Emission Rate Measurement Techniques," IBM J. Res. & Dev. 52, No. 3, 265-273 (2008, this issue).
9. H. H. K. Tang, C. E. Murray, G. Fiorenza, K. P. Rodbell, M. S. Gordon, and D. F. Heidel, "New Simulation Methodology for Effects of Radiation in Semiconductor Chip Structures," IBM J. Res. & Dev. 52, No. 3, 245-253 (2008, this issue).
10. D. F. Heidel, K. P. Rodbell, P. Oldiges, M. S. Gordon, H. H. K. Tang, E. H. Cannon, and C. Plettner, "Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells," IEEE Trans. Nucl. Sci. 53, No. 6, 3512-3517 (2006).
11. M. S. Gordon, P. Goldhagen, K. P. Rodbell, T. H. Zabel, H. H. K. Tang, J. M. Clem, and P. Bailey, "Measurement of the Flux and Energy Spectrum of Cosmic-Ray Induced Neutrons on the Ground," IEEE Trans. Nucl. Sci. 51, No. 6, 3427-3434 (2004).
12. G. R. Satchler, Nuclear Direct Reactions, Oxford University Press, New York, 1982.
13. J. F. Ziegler, Particle Interactions with Matter: SRIM - The Stopping and Range of Ions in Matter; see http://www.srim.org.
14. H. H. K. Tang and E. H. Cannon, "SEMM-2: A Modeling System for Single Event Upset Analysis," IEEE Trans. Nucl. Sci. 51, No. 6, 3342-3348 (2004).
15. S. Gerardin, M. Bagatin, P. Rech, A. Cester, and A. Paccagnella, "Exploiting a Low-Energy Accelerator to Test Commercial Electronics with Low-LET Proton Beams," paper presented at the RADECS 2006 Workshop, Athens, Greece, September 27-29, 2006.
16. K. P. Rodbell, D. F. Heidet, H. H. K. Tang, M. S. Gordon, P. Oldiges, and C. E. Murray, "Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells," IEEE Trans. Nucl. Sci. 54, No. 6, 2474-2479.
17. C. M. Hsieh, P. C. Murley, and R. R. O'Brien, "A Field-Funneling Effect on the Collection of Alpha-Particle-Generated Carriers in Silicon Devices," IEEE Electron. Dev. Lett. 2, No. 4, 103-105 (1981).
18. P. Oldiges, K. Bernstein, D. Heidel, B. Klaasen, E. Cannon, R. Dennard, H. Tang, M. Ieong, and H.-S. P. Wong, "Soft Error Rate Scaling for Emerging SOI Technology Options," 2002 Symposium on VLSI Technology, Digest of Technical Papers, 2002, pp. 46-47.
19. P. Sigmund, Springer Tracts in Modern Physics, Vol. 204, Stopping of Heavy Ions, A Theoretical Approach, Springer-Verlag, Berlin, Heidelberg, 2004.
20. E. A. Uchling, "Penetration of Heavy Charged Particles in Matter," Annu. Rev. Nucl. Sci. 4, 315-350 (December 1954).
21. U. Fano, "Penetration of Protons, Alpha Particles, and Mesons," Annu. Rev. Nucl. Sci. 13, 1-66 (December 1963).
22. L. C. Northcliffe, "Passage of Heavy Ions Through Matter," Annu. Rev. Nucl. Sci. 13, 67-102 (December 1963).
23. S. V. Starodubtsev and A. M. Romanov, The Passage of Charged Particles Through Matter [in Russian], Israel Program for Scientific Translations, Jerusalem, 1965.
24. H. Bichsel, "Barkas Effect and Effective Charge in the Theory of Stopping Power," Phys. Rev. A 41, No. 7, 3642-3647 (1990).
25. W. Heitler, "The Quantum Theory of Radiation," Third Edition, Clarendon Press, Oxford, 1954.
26. T. Tabata, R. Ito, and S. Okabe, "Generalized Semiempirical Equations for the Extrapolated Range of Electrons," Nucl. Instr. Methods 103, No. 1, 85-91 (1972).
27. E. L. Hjort, F. P. Brady, J. R. Drummond, B. McEachern, J. H. Osborne, J. L. Romero, D. S. Sorenson, and H. H. K. Tang, "Measurements of 65 MeV Fe, Sn, and Pb(n,n'x) Continuum Cross Sections," Phys. Rev. C 53, No. 1, 237-242 (1996).
28. H. H. K. Tang and J. L. Romero, "Hadron-Induced Reactions: From Basic Research to New Technological Applications," American Instilute of Physics Conference Proceedings, Vol. 392, 1997, pp. 325-328.
29. J. L. Romero, H. H. K. Tang, D. J. Morrissey, M. Fauerbach, R. Pfaff, C. F. Powell, B. M. Sherill, et al., "Nucleon-Induced Secondaries: A Review and Future Experimental Developments," American Institute of Physics Conference Proceedings, Vol. 392, 1997, pp. 655-658 (1997).
30. R. J. Peterson, G. J. Hofman, R. W. Pollock, and H. K. Tang, "Pion Production of Heavily Ionizing Particles from Aluminum," Radiat. Measur. 35, No. 6, 565-569 (2002).
31. H. H. K. Tang and K. P. Rodbell, "Single-Event Upsets in Microelectronics: Fundamental Physics and Issues," Mat. Res. Soc. Bull. 28, No. 2, 111-116 (2003).
32. H. H. K. Tang, "Nuclear Processes and Soft Fails in Microelectronics," Nucl. Phys. A 752, 706-715 (April 2005).
33. D. Horn and F. Zachariasen, Hadron Physics at Very High Energies, Vol. 40, Frontiers in Physics Series, Reading, MA, W. A. Benjamin, Inc., 1973.
34. H. Feshbach, A. Kerman, and S. Koonin, "The Statistical Theory of Multi-Step Compound and Direct Reactions," Ann. Phys. 125, No. 2, 429-476 (1980).
35. A. Bohr and B. R. Mottelson, Nuclear Structure, Vol. 1: Single-Particle Motion, World Scientific, Singapore, 1998.
36. A. Bohr and B. R. Mottelson, Nuclear Structure, Vol. 2: Nuclear Deformations, World Scientific, Singapore, 1998.
37. J. W. Negele, "The Mean-Field Theory of Nuclear Structure and Dynamics," Rev. Mod. Phys. 54, No. 4, 913-1015 (1982).
38. D. M. Brink, Semi-Classical Methods for Nucleus-Nucleus Scattering, Cambridge University Press, United Kingdom.
39. J. R. Schwank, M. R. Shaneyfelt, J. Baggio, P. E. Dodd, J. A. Felix, V. Ferlet-Cavrois, P. Paillet, et al., "Effects of Particle Energy on Proton-Induced Single-Event Latchup," IEEE Trans. Nucl. Sci. 52, No. 6, 2622-2629 (2005).
40. J. R. Schwank, M. R. Shaneyfelt, J. Baggio, P. E. Dodd, J. A. Felix, V. Ferlet-Cavrois, P. Paillet, G. K. Lum, S. Girard, and E. Blackmore, "Effects of Angle of Incidence on Proton and Neutron-Induced Single-Event Latchup," IEEE Trans. Nucl. Sci. 53, No. 6, 3122 3131 (2006).
41. K. M Warren, R. A. Weller, M. H. Mendenhall, R. A. Reed, D. R. Ball, C. L. Howe, B. D. Olson, et al., "The Contributions of Nuclear Reactions to Heavy Ion Single Event Upset Cross-Section Measurements in a High-density SEU Hardened SRAM," IEEE Trans. Nucl. Sci. 52, No. 6, 2125-2131 (2005).
42. A. V. Prokofiev, "Compilation and Systematics of Proton-Induced Fission Cross-Section Data," Nucl. Instr. Method. A 463, No. 3, 557-575 (2001).
43. 181Ta in the Intermediate Energy Region," Phys. Rev. C 70, 054603-2-054603-16 (2004).
44. R. F. Carlson, "Proton-Nucleus Total Reaction Cross Sections and Total Cross Sections UP to 1 GeV," Atomic Data Nucl. Data Tables 63, No. 1, 93-116 (1996).