Bonding and interface states of Si:Hf O2 and Si:Zr O2 interfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 7, 2006, Pages

  Peacock, P W ^a   Xiong, K ^a   Tse, K ^a   Robertson, J ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644520929     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.075328     Document Type: Article

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