Difficulties of the microscopic theory of leakage current through ultra-thin oxide barriers: Point defects

Physica Status Solidi (B) Basic Research

Volumn 239, Issue 1, 2003, Pages 48-58

  Fonseca, Leonardo R C ^a   Demkov, Alexander A ^a,c   Knizhnik, Andrey ^b  

^a MOTOROLA INC   (United States)

^b KINTECH LAB LTD   (Russian Federation)

^c MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0242556815     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200303243     Document Type: Conference Paper

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