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Volumn 69, Issue 15, 2004, Pages

First-principles exploration of alternative gate dielectrics: Electronic structure of ZrO2/Si and ZrSiO4/Si interfaces

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; SILICON; ZIRCONIUM OXIDE;

EID: 42749100720     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.155329     Document Type: Article
Times cited : (116)

References (75)
  • 33


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.