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Volumn 149, Issue 5, 2002, Pages

An electronics division retrospective (1952-2002) and future opportunities in the twenty-first century

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); DYNAMIC RANDOM ACCESS STORAGE; EPITAXIAL GROWTH; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED OPTOELECTRONICS; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY; SINGLE CRYSTALS; TRANSISTORS;

EID: 0036574811     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1471893     Document Type: Article
Times cited : (25)

References (429)
  • 16
  • 22
    • 0009347206 scopus 로고    scopus 로고
  • 23
    • 4244096895 scopus 로고    scopus 로고
    • H. R. Huff, L. Fabry, and S. Kishino, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ. In press
    • (2002) Semiconductor Silicon 2002 , vol.PV 2002-2
    • Gargini, P.1
  • 85
    • 4244096892 scopus 로고    scopus 로고
    • H. R. Huff, U. Gösele, and H. Tsuya, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1998) Semiconductor Silicon/1998 , vol.PV 98-1 , pp. 179
    • Deal, B.E.1
  • 91
    • 4243725482 scopus 로고    scopus 로고
    • H. R. Huff. U. Gösele, and H. Tsuya, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1998) Semiconductor Silicon/98 , vol.PV 98-1 , pp. 200
    • Kooi, E.1
  • 152
  • 157
    • 0019716503 scopus 로고
    • H. R. Huff, R. J. Kriegler, and Y. Takeishi, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1981) Semiconductor Silicon 1981 , vol.PV 81-5 , pp. 208
    • Sumino, K.1
  • 161
    • 0019685283 scopus 로고
    • H. R. Huff, R. I. Kriegler, and Y. Takeishi, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1981) Semiconductor Silicon 1981 , vol.PV 81-5 , pp. 220
    • Kondo, Y.1
  • 179
  • 217
    • 0344778877 scopus 로고    scopus 로고
    • H. R. Huff, U. Gösele, and H. Tsuya, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1998) Semiconductor Silicon/1998 , vol.PV 98-1 , pp. 157
    • Abe, T.1
  • 219
    • 4244104632 scopus 로고    scopus 로고
    • H. R. Huff, L. Fabry, and S. Kishino, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ. In press
    • (2002) Semiconductor Silicon 2002 , vol.PV 2002-2
    • Sinno, T.1
  • 245
  • 275
    • 84912637240 scopus 로고
    • W. M. Bullis and L. C. Kimerling, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1983) Defects in Silicon , vol.PV 83-9 , pp. 433
    • Hill, E.1
  • 302
    • 4243675226 scopus 로고
    • W. M. Bullis, U. Gösele, and F. Shimura, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1991) Defects in Silicon II , vol.PV 91-9 , pp. 211
    • Hu, S.M.1
  • 303
    • 4243642615 scopus 로고    scopus 로고
    • H. R. Huff, U. Gösele, and H. Tsuya, Editors, The Electrochemical Society Proceedings Series, Pennington, NJ
    • (1998) Semiconductor Silicon/1998 , vol.PV 98-1 , pp. 220
    • Hu, S.M.1
  • 386


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.