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Volumn 144, Issue 1, 1997, Pages 243-250

Measurement of silicon particles by laser surface scanning and angle-resolved light scattering

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DEPOSITION; LATEXES; LIGHT SCATTERING; MATHEMATICAL MODELS; PARTICLE SIZE ANALYSIS; POLYSTYRENES; SCANNING; SIGNAL TO NOISE RATIO; SURFACE ROUGHNESS; SURFACES; VLSI CIRCUITS;

EID: 0030784320     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837392     Document Type: Article
Times cited : (18)

References (20)
  • 2
    • 0003552056 scopus 로고
    • Semiconductor Industry Association, San Jose, CA 95129, Nov.
    • National Technology Roadmap for Semiconductors, Semiconductor Industry Association, San Jose, CA 95129, Nov. 1994.
    • (1994) National Technology Roadmap for Semiconductors
  • 3
    • 0004115608 scopus 로고
    • Dover Publications, Inc. New York
    • General light scattering theory, including Rayleigh scattering, is well covered by the following texts: (a) H. C. van de Hulst, Light Scattering by Small Particles, Dover Publications, Inc. New York (1981) (b) C. R. Bohren and D. Huffman, Absorption and Scattering of Light by Small Particles, Wiley-Interscience, New York (1983). Reference 4 additionally covers light scattering from surfaces.
    • (1981) Light Scattering by Small Particles
    • Van De Hulst, H.C.1
  • 4
    • 21444460118 scopus 로고
    • Wiley-Interscience, New York
    • General light scattering theory, including Rayleigh scattering, is well covered by the following texts: (a) H. C. van de Hulst, Light Scattering by Small Particles, Dover Publications, Inc. New York (1981) (b) C. R. Bohren and D. Huffman, Absorption and Scattering of Light by Small Particles, Wiley-Interscience, New York (1983). Reference 4 additionally covers light scattering from surfaces.
    • (1983) Absorption and Scattering of Light by Small Particles
    • Bohren, C.R.1    Huffman, D.2
  • 6
    • 5844257090 scopus 로고    scopus 로고
    • Tencor Instruments, Private communication
    • 8. S. Stokowski, Tencor Instruments, Private communication.
    • Stokowski, S.1
  • 7
    • 0001862016 scopus 로고
    • H. R. Huff, W. Bergholz, and K. Sumino, Editors. PV 94-10, The Electrochemical Society Proceedings Series, Pennington, NJ
    • W. M. Bullis, in SEMICONDUCTOR SILICON/1994, H. R. Huff, W. Bergholz, and K. Sumino, Editors. PV 94-10, p. 1156, The Electrochemical Society Proceedings Series, Pennington, NJ (1994).
    • (1994) Semiconductor Silicon/1994 , pp. 1156
    • Bullis, W.M.1
  • 14
    • 5844394798 scopus 로고
    • K. L. Mittal, Editor, Plenum Press, New York
    • R. J. Champetier, M. Sobelman, and J. R. Blanco, in Particles on Surfaces 3, K. L. Mittal, Editor, Plenum Press, New York (1991). This reference describes the use of this technique to characterize the unintentional contamination of optical surfaces.
    • (1991) Particles on Surfaces 3
    • Champetier, R.J.1    Sobelman, M.2    Blanco, J.R.3
  • 18
    • 0029728106 scopus 로고    scopus 로고
    • Metrology, Inspection, and Process Control for Microlithography X, S. Jones, Editor
    • B. M. Nebeker, R. Schmehl, G. W. Starr, E. D. Hirleman, in Metrology, Inspection, and Process Control for Microlithography X, S. Jones, Editor, Proc. SPIE, 2725, 690 (1996).
    • (1996) Proc. SPIE , vol.2725 , pp. 690
    • Nebeker, B.M.1    Schmehl, R.2    Starr, G.W.3    Hirleman, E.D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.