Nanoscale surface analysis that combines scanning probe microscopy and mass spectrometry: A critical review

TrAC - Trends in Analytical Chemistry

Volumn 75, Issue , 2016, Pages 24-34

  Liang, Zhisen ^a   Yin, Zhibin ^a   Yang, Hang ^a   Xiao, Yuanfang ^a   Hang, Wei ^a   Li, Jianfeng ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

Atom probe; Direct solid and surface analysis; Laser assisted ionization; Laser induced near field effect; Localized thermal analysis; Mass spectrometry; Nanoscale lateral resolution; Scanning probe microscopy

Indexed keywords

ATOM LASERS; BIOLOGICAL MATERIALS; CHEMICAL ANALYSIS; HYDROPHOBICITY; MASS SPECTROMETRY; NANOTECHNOLOGY; SPECTROMETRY; SURFACE ANALYSIS; THERMOANALYSIS;

ATOM PROBE; LASER-ASSISTED; LATERAL RESOLUTION; LOCALIZED THERMAL ANALYSIS; NEAR FIELD EFFECT;

SCANNING PROBE MICROSCOPY;

ANALYTIC METHOD; ATOM PROBE SCANNING TUNNEL MICROSCOPY; ATOM PROBE TOMOGRAPHY; COHERENT ANTI STOKES RAMAN SPECTROSCOPY; INFRARED SPECTROSCOPY; LASER ABLATION INDUCTIVELY COUPLED MASS SPECTROMETRY; LASER DESORPTION MASS SPECTROMETRY; LIMIT OF DETECTION; MASS SPECTROMETRY; MATRIX ASSISTED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY; NANOANALYSIS; NANOTECHNOLOGY; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY TRANSMISSION X RAY MICROSCOPY; NEAR FIELD LASER ABLATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; NEAR FIELD LASER ABLATION ION TRAP TIME OF FLIGHT MASS SPECTROMETRY; NEAR FIELD LASER ABLATION QUADRUPOLE MASS SPECTROMETRY; NEAR FIELD TIME OF FLIGHT MASS SPECTROMETRY; PHOTOACTIVATED LOCALIZED MICROSCOPY; PHOTOTHERMALLY INDUCED RESONANCE; PRIORITY JOURNAL; REVIEW; SCANNING AUGER ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY ENERGY DISPERSIVE X RAY SPECTROSCOPY; SCANNING MATRIX ASSISTED LASER DESORPTION IONIZATION MASS SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING PHOTOEMISSION ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SCANNING PROBE MICROSCOPY TIME OF FLIGHT MASS SPECTROMETRY; SCANNING TRANSMISSION ELECTRON MICROSCOPY ENERGY DISPERSIVE X RAY SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY TIME OF FLIGHT MASS SPECTROMETRY; STIMULATED EMISSION DEPLETION; STOCHASTIC OPTICAL RECONSTRUCTION MICROSCOPY; SURFACE PROPERTY; SYNCHROTRON X RAY FLUORESCENCE MICROSCOPY; THERMAL DESORPTION ELECTROSPRAY IONIZATION MASS SPECTROMETRY; TIP ENHANCED LINEAR ION TRAP QUADRUPOLE MASS SPECTROMETRY; TIP ENHANCED RAMAN SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY ELECTRON ENERGY LOSS SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY PHOTOEMISSION ELECTRON MICROSCOPY;

EID: 84947566486     PISSN: 01659936     EISSN: 18793142     Source Type: Journal    
DOI: 10.1016/j.trac.2015.07.009     Document Type: Review

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