Atom probe tomography today

Materials Today

Volumn 10, Issue 12, 2007, Pages 36-42

  Cerezo, Alfred ^a,b   Clifton, Peter H ^c   Galtrey, Mark J ^d   Humphreys, Colin J ^d   Kelly, Thomas F ^c   Larson, David J ^c   Lozano Perez, Sergio ^b   Marquis, Emmanuelle A ^a,b   Oliver, Rachel A ^d   Sha, Gang ^b   Thompson, Keith ^c   Zandbergen, Mathijs ^b   Alvis, Roger L ^c  

^a Opal UK National Atom Probe Facility   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c Imago Scientific Instruments   (United States)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVEL CHARACTERIZATION; ATOMIC-SCALE INVESTIGATION; LASER PULSING; SITE SPECIFIC REGIONS;

ION BEAMS; LASER PULSES; OXIDE FILMS; SPECIMEN PREPARATION;

TOMOGRAPHY;

EID: 36049025875     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(07)70306-1     Document Type: Review

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