Nanoscale spectroscopy with polarized X-rays by NEXAFS-TXM

Nature Photonics

Volumn 6, Issue 1, 2012, Pages 25-29

  Guttmann, Peter ^a   Bittencourt, Carla ^b   Rehbein, Stefan ^a   Umek, Polona ^c   Ke, Xiaoxing ^b   Van Tendeloo, Gustaaf ^b   Ewels, Chris P ^d   Schneider, Gerd ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF ANTWERP   (Belgium)

^c JO EF STEFAN INSTITUTE   (Slovenia)

^d INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84355161949     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2011.268     Document Type: Article

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