Structural analyses in three-dimensional atom probe: A Fourier transform approach

Journal of Microscopy

Volumn 203, Issue 3, 2001, Pages 295-302

  Vurpillot, F ^a   Da Costa, G ^a   Menand, A ^a   Blavette, D ^a  

^a Site Universitaire Du Madrillet   (France)

Author keywords

Fourier transform; Image analysis; Three dimensional atom probe

Indexed keywords

DISCRETE FOURIER TRANSFORMS; IMAGE RESOLUTION; PROBES; TERNARY ALLOYS;

DARK FIELD IMAGING; DISORDERED MATRICES; FOURIER; FOURIER TRANSFORM ALGORITHMS; IMAGE-ANALYSIS; MEAN SIZE; ORDERED GRAINS; REAL-SPACE; SPATIAL RESOLUTION; THREE-DIMENSIONAL ATOM PROBE;

ATOMS;

EID: 0000467272     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00923.x     Document Type: Article

References (19)

1. Blavette, D., Bostel, A., Sarrau, J.M., Deconihout, B. & Menand, A. (1993) An atom probe for three-dimensional tomography. Nature, 363, 432-434.
2. Blavette, D., Deconihout, B., Chambreland, S. & Bostel, A. (1998) Three-dimensional imaging of chemical order with the tomographic atom probe. Ultramicroscopy. 70, 115-124.
3. Camus, P.P., Larson, D.J. & Kelly, T.F. (1995) A method for reconstructing and locating atoms on the crystal lattice in three-dimensional atom probe data. Appl. Surf. Sci. 87/88, 305-310.
4. Cerezo, A., Abraham, M., Lane, H., Larson, D.J., Thuvander, M., Seto, K., Warren, P.J. & Smith, G.D.W. (1999) Three-dimensional atomic scale analysis of interfaces. Electron Microscopy and Analysis 1999. Inst. Phys. Conf. Ser. 161, 29-34.
5. Cerezo, A., Godfrey, T.J. & Smith, G.D.W. (1988) Application of a position-sensitive detector to atom probe microanalysis. Rev. Sci. Instrum. 59, 862.
6. Deconihout, B., Renaud, L., Da Costa, G., Bouet, M., Bostel, A. & Blavette, D. (1998) Implementation of an optical TAP: preliminary results. Ultramicroscopy. 73, 253-260.
7. Guinier, A. & Fournet, G. (1955) Small-Angle Scattering of X-Rays. John Wiley & Sons Inc. New York.
8. Kostorz, G. (1979) Small-angle scattering and its applications to materials science. Treatise Mater. Sci. Technol. 15, 227-289.
9. Miller, M.K. (2000) The development of atom probe field-ion microscopy. Mater. Charac. 44, 11.
10. Miller, M.K., Cerezo, A., Hetherington, M.G. & Smith, G.D.W. (1996) Atom Probe Field Ion Microscopy. Clarendon Press, Oxford, pp. 196-199.
11. Müller, E.W. & Tsong, T.T. (1969) Field Ion Microscopy Principles and Applications. Elsevier, New York.
12. 22 kinetic reaction. Scripta Mater. 44, 243-247.
13. Schmuck, C., Caron, P., Hauet, A. & Blavette, D. (1997) Ordering and precipitation of γ′ phase in low superaturated Ni-Cr-Al model alloy: an atomic scale investigation. Phil. Mag. 76, 527-542.
14. Vurpillot, F., Bostel, A. & Blavette, D. (2000b) Trajectory overlap and local magnification in three-dimensional atom probe. Appl. Phys. Lett. 76, 3127-3139.
15. Vurpillot, F., Bostel, A., Cadel, E. & Blavette, D. (2000a) The spatial resolution of 3D atom probe in the investigation of single-phase materials. Ultramicroscopy. 84, 213-224.
16. Vurpillot, F., Bostel, A., Menand, A. & Blavette, D. (1999) Trajectories of field emitted ions in 3D atom-probe. Eur. Phys J. Appl. Phys. 6, 217-221.
17. Warren, P.J., Cerezo, A. & Smith, G.D.W. (1998a) Observation of atomic planes in 3DAP. Ultramicroscopy. 73, 261-266.
18. Warren, P.J., Cerezo, A. & Smith, G.D.W. (1998b) Towards 3D lattice reconstruction with the position sensitive atom probe. Mater. Sci. Eng. A250, 88-89.
19. Waugh, A.R., Boyes, E.D. & Southon, M.J. (1976) Investigations of field evaporation with a field-desorption microscope. Surf. Sci. 61, 109-142.