High-resolution XPS spectromicroscopy

Surface and Interface Analysis

Volumn 42, Issue 6-7, 2010, Pages 816-825

  Renault, O ^a  

^a CEA GRENOBLE   (France)

Author keywords

Energy filter; Spectromicroscopy; XPEEM

Indexed keywords

AREA OF INTEREST; CORE LEVELS; ENERGY FILTER; FUTURE PERSPECTIVES; HEMISPHERICAL ANALYZERS; HIGH RESOLUTION; HISTORICAL REVIEW; IMAGING SPECTROMETERS; LABORATORY SOURCE; LATERAL RESOLUTION; PARALLEL IMAGING METHOD; PHOTOELECTRON EMISSION MICROSCOPES; QUANTITATIVE ANALYSIS; RECIPROCAL SPACE; SPECTROMICROSCOPY; X-RAY PHOTOELECTRON EMISSION MICROSCOPIES; XPS; XPS IMAGING;

IMAGING TECHNIQUES; PHOTOIONIZATION; PHOTONS; POWER SUPPLY CIRCUITS; X RAY PHOTOELECTRON SPECTROSCOPY;

LABORATORIES;

EID: 77954265658     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3521     Document Type: Conference Paper

References (41)

1. J. T. Grant, D. Briggs, in Surface Analysis by Auger and Photoelectron Spectroscopy, IM Publications: Chichester, UK, 2003, p. 295, 345.
2. E. Sokolowski, C. Nordling, K. Siegbahn, Phys. Rev. 1958, 110, 776.
3. O. Renault, N. Barrett, A. Bailly, L.-F. Zagonel, D. Mariolle, J. C. Cezar, N. Brookes, K. Winkler, B. Krömker, D. Funnemann (eds), Surf. Sci. 2007, 601, 4727.
4. M. Escher, K. Winkler, O. Renault, N. Barrett (eds), J. Electron. Spec. Relat. Phenom. 2010, 178-179, 303.
5. O. Renault, M. Lavayssière, A. Bailly, D. Mariolle, N. Barrett, J. Electron. Spec. Relat. Phenom. 2009, 171, 68.
6. G. De Stasio, B. H. Frazer, B. Gilbert, K. L. Richter, J. W. Valley, Ultramicroscopy 2003, 98, 57.
7. B. Gilbert, G. Margaritondo, S. Douglas, K. H. Nealson, R. F. Egerton, G. F. Rempfer, G. De Stasio, J. Electron. Spec. Relat. Phenom. 2001, 114-116, 997.
8. L. Chaney Robert, Surf. Interface Anal. 1987, 10, 36.
9. P. Coxon, J. Krizek, M. Humpherson, I. R. M. Wardell, J. Electron. Spec. Relat. Phenom. 1990, 52, 821.
10. M. P. Seah, G. C. Smith, Surf. Interface Anal. 1988, 11, 69.
11. S. Günther, B. Kaulich, L. Gregoratti, M. Kiskinova, Prog. Surf. Sci. 2002, 70, 187.
12. http://www.phi.com/products/quantera/overview.html.
13. D. E. Peebles, J. A. Ohlhausen, P. G. Kotula, S. Hutton, C. Blomfield, J. Vac. Sci. Technol. A., 2004, 22, 1579.
14. http://www.thermo.com/fr/com/cda/product/detail/ 0ESCALAB250productinformation,1055,15885,00.html.
15. W. John, F. Neal, Surf. Interface Anal. 2006, 38, 1230.
16. Product Information Axis Ultra, Kratos Analytical (Shimadzu).
17. E. F. Smith, D. Briggs, N.Fairley, Surf. Interface Anal. 2006, 38, 69.
18. B. A. Kobe, S. Ramamurthy, M. C. Biesinger, N. S. Mcintyre, A. M. Brennenstühl, Surf. Interface Anal. 2005, 37, 478.
19. J. Walton, N. Fairley, Surf. Interface Anal. 2008, 40, 478.
20. J. Walton, N. Fairley, J. Electron. Spec. Relat. Phenom. 2005, 148, 29.
21. J. Walton, N. Fairley, Surf. Interface Anal. 2008, 40, 478.
22. J. Walton, N. Fairley, Surf. Interface Anal. 2009, 41, 114.
23. S. Hajati, S. Tougaard, J. Walton, N. Fairley, Surf. Sci. 2008, 602, 3064.
24. J. Walton, N. Fairley, Surf. Interface Anal. 2004, 36, 89.
25. W. John, F. Neal, Surf. Interface Anal. 2006, 38, 388.
26. M. Escher, N. Weber, M. Merkel, C. Ziethen, P. Bernhard, G. Schönhense, S. Schmidt, S. F. Forster, F. Reinert, B. Krömker, D. Funnemann, J. Phys. Condens. Matter 2005, 17, S1329.
27. B. P. Tonner, Nucl. Instrum. Methods Phys. Res., Sect. A 1990, 291, 60.
28. B. P. Tonner, D. Dunham, T. Droubay, M. Pauli, J. Electron.Spec.Relat. Phenom. 1997, 84, 211.
29. C. M. Schneider, G. Schönhense, Rep. Prog. Phys. 2002, 65, 1785.
30. E. Brüche, Zeitschrift für Physik 1933, 86, 448.
31. E. Bauer, Ultramicroscopy 1985, 17, 51.
32. G. F. Rempfer, W. P. Skoczylas, O. H. Griffith, Ultramicroscopy 1991, 36, 196.
33. P. Bernhard, J. Maul, U. Ott, Ch. Sudek, M. Escher, N. Weber, M. Merkel, B. Kromker, D. Funnemann, G. Schönhense, Nucl. Instrum. Methods Phys. Res. Sect. B 2006, 246, 275.
34. P. Bernhard, J. Maul, T. Berg, F. Wegelin, U. Ott, Ch. Sudek, S. Merchel, G. Schönhense, Phys. Rev. B 2006, 74, 075401.
35. B. Tonner, Nucl. Instrum. Methods Phys. Res., Sect. A 1990, 291, 60.
36. L. F. Zagonel, N. Barrett, O. Renault, A. Bailly, M. Baürer, M. Hoffmann, S.-J. Shih, D. Cockayne, Surf. Interface Anal. 2008, 40, 1709.
37. A. Bailly, O. Renault, N. Barrett, L. F. Zagonel, P. Gentile, N. Pauc, F. Dhalluin, T. Baron, A. Chabli, J. C. Cezar, N. B. Brookes, Nano Letters 2008, 8, 3709.
38. J. Charlier, S. Palacin, J. Leroy, D. Del Frari, L. F. Zagonel, N. Barrett, O. Renault, A. Bailly, D. Mariolle, J. Mater. Chem. 2008, 18, 3136.
39. N. Barrett, L. F. Zagonel, O. Renault, A. Bailly, J. Phys. Condens.Matter 2009, 21, 314015.
40. F. de la Peña, N. Barrett, L. F. Zagonel, M. Walls, O. Renault, Surf. Sci. (submitted, 2010).
41. B. Kromker, M. Escher, D. Funnemann, D. Hartung, H. Engelhard, J. Kirschner, Rev. Sci. Instrum. 2008, 79, 053702.