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Volumn 25, Issue 7-8, 1997, Pages 500-504
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Focusing of laser radiation in the near-field of a tip (FOLANT) for applications in nanostructuring
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Author keywords
Atomic force microscopy (AFM); Laser; Nanoprocessing; Near field technology; Scanning tunnelling microscopy (STM)
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRODYNAMICS;
ELECTROSTATICS;
FOCUSING;
GOLD;
LASER APPLICATIONS;
NANOTECHNOLOGY;
RAMAN SPECTROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SUBSTRATES;
FOCUSING OF LASER RADIATION IN THE NEAR FIELD OF A TIP (FOLANT);
LASER RADIATION;
SURFACE ENHANCE RAMAN SPECTROSCOPY (SERS);
NANOSTRUCTURED MATERIALS;
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EID: 0031153473
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<500::aid-sia258>3.0.co;2-6 Document Type: Article |
Times cited : (44)
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References (14)
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