Tip-enhanced Raman microscopy: Practicalities and limitations

Journal of Raman Spectroscopy

Volumn 34, Issue 9, 2003, Pages 663-667

  Richards, D ^a   Milner, R G ^a   Huang, F ^a   Festy, F ^a  

^a KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

Near field optical microscopy; NSOM; SERS; SNOM; Surface plasmons; Surface enhanced Raman scattering

Indexed keywords

CARBON; ELECTRIC EXCITATION; ELECTRIC FIELDS; FINITE DIFFERENCE TIME DOMAIN METHOD; GOLD; RAMAN SCATTERING; SILVER; SURFACE SCATTERING;

APERTURELESS SCANNING; CARBON CONTAMINATION; ENHANCED RAMAN SCATTERING; NEAR FIELD OPTICAL MICROSCOPY; RAMAN ENHANCEMENT; RAMAN MICROSCOPY; SERS; SURFACE ENHANCED RAMAN; SURFACE-ENHANCED RAMAN SCATTERING; SURFACE-PLASMON;

SURFACE PLASMONS;

GOLD; SILVER;

ARTICLE; DIELECTRIC CONSTANT; ELECTRIC FIELD; ELECTROMAGNETIC FIELD; LIGHT SCATTERING; MICROSCOPY; RAMAN MICROSCOPY; RAMAN SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SIGNAL TRANSDUCTION; WAVEFORM;

EID: 0141817901     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.1046     Document Type: Article

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