Tungsten silicide formation on an STM tip during atom manipulation

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Shimizu, T ^a   Kim, J T ^b   Tokumoto, H ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOM MANIPULATION; ATOM PROBE; CHEMICAL SPECIES; MASS SPECTRA; SCANNING TUNNELING MICROSCOPES; SI(0 0 1); SILICIDE FORMATION; TUNGSTEN SILICIDE;

ATOMS; MASS SPECTROMETRY; SILICIDES; SILICON; TUNGSTEN;

ATOMIC SPECTROSCOPY;

EID: 3843066354     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051240     Document Type: Article

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