Local field enhancement with an apertureless near-field-microscope probe

Optics Communications

Volumn 148, Issue 4-6, 1998, Pages 221-224

  Furukawa, Hiromitsu ^a,b   Kawata, Satoshi ^a  

^a OSAKA UNIVERSITY   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

Apertureless NSOM; FDTD analysis; Field enhancement; Light scattering; Metallic probe

Indexed keywords

COMPUTER SIMULATION; ELECTROMAGNETIC FIELDS; FINITE DIFFERENCE METHOD; LIGHT POLARIZATION; LIGHT SCATTERING; LIGHTING; MAXWELL EQUATIONS; PROBES; TIME DOMAIN ANALYSIS;

NEAR FIELD SCANNING OPTICAL MICROSCOPES (NSOM);

OPTICAL MICROSCOPY;

EID: 0032025663     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00687-1     Document Type: Article

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