Thermal radiation scanning tunnelling microscopy

Nature

Volumn 444, Issue 7120, 2006, Pages 740-743

  De Wilde, Yannick ^a   Formanek, Florian ^a,e   Carminati, Rémi ^b   Gralak, Boris ^b   Lemoine, Paul Arthur ^a   Joulain, Karl ^c   Mulet, Jean Philippe ^b,f   Chen, Yong ^b,d   Greffet, Jean Jacques ^b  

^a PSL RESEARCH UNIVERSITY   (France)

^b CNRS   (France)

^c ENSMA   (France)

^d ECOLE NORMALE SUPÉRIEURE   (France)

^e RIKEN   (Japan)

^f SAINT GOBAIN RECHERCHE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; SCANNING TUNNELLING MICROSCOPY; TEMPERATURE EFFECT;

ARTICLE; ILLUMINATION; INFRARED RADIATION; MICROSCOPE; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PRIORITY JOURNAL; RADIATION; SCANNING TUNNELING MICROSCOPY; SIGNAL DETECTION; SURFACE PLASMON RESONANCE; THERMAL RADIATION SCANNING TUNNELING MICROSCOPY;

EID: 33845623221     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature05265     Document Type: Article

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