Atom probe tomography of oxide scales

Oxidation of Metals

Volumn 79, Issue 3-4, 2013, Pages 227-238

  Stiller, K ^a   Viskari, L ^a   Sundell, G ^a   Liu, F ^a   Thuvander, M ^a   Andren H O ^a   Larson, D J ^b   Prosa, T ^b   Reinhard, D ^b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b CAMECA   (United States)

Author keywords

Atom probe tomography; Atomic scale; Microstructure; Oxides

Indexed keywords

ALUMINA; ALUMINUM ALLOYS; ALUMINUM OXIDE; BINARY ALLOYS; CHROMIUM ALLOYS; CRACK TIPS; DIFFUSION COATINGS; II-VI SEMICONDUCTORS; IRON ALLOYS; MAGNESIA; METALS; MICROSTRUCTURE; NICKEL ALLOYS; OXIDE MINERALS; OXIDES; PLATINUM ALLOYS; PROBES; SCALE (DEPOSITS); TERNARY ALLOYS; ZINC ALLOYS; ZINC OXIDE; ZIRCALOY;

ATOM PROBE TOMOGRAPHY; ATOMIC SCALE; CONDUCTING MATERIALS; METAL OXIDE INTERFACE; MICRO-STRUCTURAL; OXIDATION PROCESS; SPATIAL RESOLUTION; THERMALLY GROWN OXIDE SCALE;

ATOMS;

EID: 84876475974     PISSN: 0030770X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11085-012-9330-6     Document Type: Article

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