Interpreting the signal from a localized fluorescence sensor: A study by angle-resolved XPS and dynamic SIMS

Journal of Colloid and Interface Science

Volumn 262, Issue 2, 2003, Pages 594-602

  Woerdeman, Dara L ^a   Ou, Wei ^b   Lenhart, Joseph L ^c,e   Parnas, Richard S ^d  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b Materials Characterization Group   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^d UNIVERSITY OF CONNECTICUT   (United States)

^e SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Angle resolved XPS; Fluorescent probe; Glass epoxy interface; Glycidoxysilane; Organosilanes; Silane modified glass; SIMS

Indexed keywords

COATINGS; CURING; FLUORESCENCE; GLASS; MOLECULAR STRUCTURE; SECONDARY ION MASS SPECTROMETRY; SILANES; X RAY PHOTOELECTRON SPECTROSCOPY;

RESIN HARDENERS;

SURFACE TREATMENT;

DIAMINE; GLASS; RESIN; SILANE DERIVATIVE;

ANISOTROPY; ARTICLE; CHEMICAL INTERACTION; CRYSTAL STRUCTURE; DILUTION; FLUORESCENCE; IMMERSION; MASS SPECTROMETRY; MOLECULAR DYNAMICS; PRIORITY JOURNAL; SENSOR; SIGNAL PROCESSING; THICKNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0038362162     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0021-9797(03)00147-4     Document Type: Article

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