The mechanism of nanostructuring upon nanosecond laser irradiation of a STM tip

Applied Physics A: Materials Science and Processing

Volumn 67, Issue 4, 1998, Pages 381-384

  Boneberg, J ^a   Munzer H J ^a   Tresp, M ^a   Ochmann, M ^a   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTROMAGNETIC FIELDS; LASER PULSES; NANOTECHNOLOGY; PROBES; Q SWITCHED LASERS; SCANNING TUNNELING MICROSCOPY; SOLID STATE LASERS; THERMAL EXPANSION; TRANSIENTS; ULTRAFAST PHENOMENA;

FEMTOSECOND LASER PULSES; NANOSECOND LASER PULSES; NANOSTRUCTURING; SCANNING PROBE TIPS; TUNNELING CURRENT;

LASER BEAM EFFECTS;

EID: 0032182366     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050789     Document Type: Article

References (23)

1. A.A. Gorbunov, W. Pompe: Phys. Status Solidi A 145, 333 (1994)
2. K. Dickmann, J. Jersch: Laser Optoelektron. 27, 76 (1995)
3. J. Jersch, K. Dickmann: Appl. Phys. Lett. 68, 868 (1996)
4. J. Jersch, F. Demmmg, K. Dickmann: Appl. Phys. A 64, 29 (1997)
5. J. Jersch, F. Demmig, L.J. Hildenhagen, K. Dickmann: Appl. Phys. A 66, 29 (1998)
6. V.A. Ukraintsev, J.T. Yates, Jr.: J. Appl. Phys. 80, 2561 (1996)
7. I. Lyubinetsky, Z. Dohnálek, V.A. Ukraintsev, J.T. Yates, Jr.: J. Appl. Phys. 82, 4115 (1997)
8. J. Boneberg, M. Tresp, M. Ochmann, H.-J. Münzer, P. Leiderer: Appl. Phys. A 66, 615 (1998)
9. R. Huber, M. Koch, M. Perner, W. Spirkl, J. Feldmann: Proceedings of the Conference on Lasers and Electro-Optics 1998, Technical Digest, CFH4, San Francisco, CA, May 1997
10. V. Gerstner, A. Knoll, J. Lehmann, M. Merschdorf, W. Pfeiffer, A. Thon, G. Gerber: Verbandl. DPG (VI) 33, O34.48 (1998)
11. Ch. Lienau, A. Richter, T. Elsaesser: Appl. Phys. Lett. 96, 325 (1996)
12. A slightly higher energy density was used here in order to achieve a pronounced effect on the timescale of the resolution of our measurement
13. J.I. Pascual, J. Méndez, J. Gómez-Herrero, A.M. Baró, N. Garcia, U. Landmann, W.D. Luedtke, E.N. Bogachek, H.-P. Cheng: Science 267, 1795 (1995)
14. J.M. Krans, J.M. van Rultenbeek, V.V. Flans, I.K. Yanson, L.J. de Jongh: Nature 375, 767 (1995)
15. J.A. Torres, J.J. Senz: Phys. Rev. Lett. 77, 2245 (1996)
16. I.P. Batra: Surf. Sci. 395, 43 (1998)
17. J.K. Gimzewski, R. Möller: Phys. Rev. B 36, 1284 (1987)
18. C.X. Guo, D.J. Thomson: Ultramicroscopy 42-44, 1452 (1992)
19. T.C. Chang, C.S. Chang, H.N. Lin, T.T. Tsong: Appl. Phys. Lett. 67, 903 (1995)
20. J.I. Pascual, J. Méndez, J. Gómez-Herrero, A.M. Baró, N. Garcia: Phys. Rev. Lett. 71, 1852 (1993)
21. W. Denk, D.W. Pohl: J. Vac. Sci. Technol. B 9, 510 (1991)
22. O.J.F. Martin, C. Girard: Appl. Phys. Lett. 70, 705 (1997)
23. L. Nowotny, R.X. Bian, X.S. Xie: Phys. Rev. Lett. 79, 645 (1997)