Finite element method simulation of the field distribution for AFM tip-enhanced surface-enhanced Raman scanning microscopy

Journal of Physical Chemistry B

Volumn 107, Issue 7, 2003, Pages 1574-1584

  Micic, Miodrag ^a   Klymyshyn, Nicholas ^a   Suh, Yung Doug ^a   Lu, H Peter ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD DISTRIBUTIONS;

ELECTRIC FIELD EFFECTS; FINITE ELEMENT METHOD; FREQUENCY DOMAIN ANALYSIS; LASER BEAMS; LIGHTING; MAXWELL EQUATIONS; NANOSTRUCTURED MATERIALS; RAMAN SPECTROSCOPY; SILVER; SURFACE PHENOMENA;

ATOMIC FORCE MICROSCOPY;

EID: 0037456454     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp022060s     Document Type: Article

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