Resolution scaling in STED microscopy

Optics Express

Volumn 16, Issue 6, 2008, Pages 4154-4162

  Harke, Benjamin ^a   Keller, Jan ^a   Ullal, Chaitanya K ^a   Westphal, Volker ^a   Schönle, Andreas ^a   Hell, Stefan W ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE RESOLUTION; PATTERN MATCHING; SCALING LAWS; SPATIAL VARIABLES CONTROL; STIMULATED EMISSION;

IMAGE BRIGHTNESS; RESOLUTION SCALING; SPATIAL RESOLUTION; SQUARE ROOT LAW; STIMULATED EMISSION DEPLETION MICROSCOPY (STEDM);

OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; FLUORESCENCE MICROSCOPY; IMAGE ENHANCEMENT; METHODOLOGY; THEORETICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MICROSCOPY, FLUORESCENCE; MODELS, THEORETICAL;

EID: 41149162299     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.004154     Document Type: Article

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