High-spatial-resolution scanning X-ray fluorescence microscope with Kirkpatrick-Baez mirrors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6317, Issue , 2006, Pages

  Matsuyama, Satoshi ^a   Mimura, Hidekazu ^a   Shimura, Mari ^b   Yumoto, Hirokatsu ^a   Katagishi, Keiko ^a   Handa, Soichiro ^a   Shibatani, Akihiko ^a   Sano, Yasuhis ^a   Yamamura, Kazuya ^a   Nishino, Yoshinori ^c   Tamasaku, Kenji ^d   Yabashi, Makina ^d   Ishikawa, Tetsuya ^c,d   Yamauchi, Kazuto ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NATIONAL CENTER FOR GLOBAL HEALTH AND MEDICINE   (Japan)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^d RIKEN   (Japan)

Author keywords

Diffraction limited focusing; EEM; Elemental mapping; Kirkpatrick Baez; MSI; Plasma CVM; RADSI; Scanning X ray fluorescence microscope; X ray focusing; X ray microscopy

Indexed keywords

FLUORESCENCE; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; X RAY ANALYSIS;

DIFFRACTION LIMITED FOCUSING; ELEMENTAL MAPPING; KIRKPATRICK-BAEZ; X-RAY FOCUSING;

MIRRORS;

EID: 33750591667     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.681964     Document Type: Conference Paper

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