Laser-assisted atom probe tomography of oxide materials

Microscopy and Microanalysis

Volumn 13, Issue 5, 2007, Pages 342-346

  Oberdorfer, Christian ^a   Stender, Patrick ^a   Reinke, Christoph ^a   Schmitz, Guido ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Compositional analysis; Field induced oxidation; Laser assisted atom probe tomography; Nickel oxide; Thermal pulsing; Thin films; Tungsten oxide

Indexed keywords

EID: 34948819661     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927607070274     Document Type: Article

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