Atomic species identification in scanning tunneling microscopy by time-of-flight spectroscopy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 3, 1996, Pages 1587-1590

  Spence, J C H ^a   Weierstall, U ^a   Lo, W ^b  

^a ARIZONA STATE UNIVERSITY   (United States)

^b Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001692438     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589195     Document Type: Article

References (18)

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