Development of scanning x-ray fluorescence microscope with spatial resolution of 30 nm using Kirkpatrick-Baez mirror optics

Review of Scientific Instruments

Volumn 77, Issue 10, 2006, Pages

  Matsuyama, S ^a   Mimura, H ^a   Yumoto, H ^a   Sano, Y ^a   Yamamura, K ^a   Yabashi, M ^b   Nishino, Y ^c   Tamasaku, K ^c   Ishikawa, T ^c   Yamauchi, K ^a  

^a OSAKA UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c SPring 8/RIKEN ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; LIGHT TRANSMISSION; MICROSCOPIC EXAMINATION; MIRRORS; PRODUCT DEVELOPMENT; X RAY ANALYSIS;

BEAM PROFILES; KIRKPATRICK-BAEZ MIRROR OPTICS; SCANNING X-RAY FLUORESCENCE MICROSCOPE (SXFM); X-RAY BEAMS;

OPTICAL ENGINEERING;

EID: 33750512411     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2358699     Document Type: Conference Paper

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