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Volumn 15, Issue 6, 2012, Pages 615-626

Si and Ge nanocrystals for future memory devices

Author keywords

Ion implantation; Nanocrystals; Non volatile memory

Indexed keywords

CROSSTALK EFFECT; DESIGN FLEXIBILITY; DIELECTRIC STACK; ELECTRICAL STUDIES; FLOATING NODES; FLOATING-GATES; GATE INSULATOR; GATE OXIDE; GE NANOCRYSTALS; HOST MATRICES; IN-VACUUM; INSULATOR LAYER; ION BEAM SYNTHESIS; LOW-VOLTAGE; MATERIAL SCIENCE; MEMORY CELL; NANOCRYSTAL MEMORIES; NON-VOLATILE MEMORIES; NONVOLATILITY; OXIDATION PROCESS; RESEARCH EFFORTS; STRUCTURAL CHARACTERIZATION; SYSTEMATIC INVESTIGATIONS; TECHNOLOGICAL ROUTE; TUNNEL OXIDES;

EID: 84870066183     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2012.09.004     Document Type: Review
Times cited : (45)

References (58)
  • 4
    • 79959999021 scopus 로고    scopus 로고
    • Highly optimized nanocrystal-based split gate flash for high performance and low power microcontroller applications
    • J. Yater, Highly optimized nanocrystal-based split gate flash for high performance and low power microcontroller applications. in: Proceedings of the 3rd International Memory Workshop (IMW), 2011.
    • (2011) Proceedings of the 3rd International Memory Workshop (IMW)
    • Yater, J.1
  • 23
    • 33750920060 scopus 로고    scopus 로고
    • Ion-beam synthesis of nanocrystals for multidot memory structures
    • E. Zschech, C. Whelan, Mikolajick Th, Springer London
    • V. Beyer, and J. Von Borany Ion-beam synthesis of nanocrystals for multidot memory structures E. Zschech, C. Whelan, Mikolajick Th, Materials for Information Technology 2005 Springer London pp. 139-147
    • (2005) Materials for Information Technology , pp. 139-147
    • Beyer, V.1    Von Borany, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.