Silicon nanocrystal non-volatile memory for embedded memory scaling

Microelectronics Reliability

Volumn 47, Issue 4-5 SPEC. ISS., 2007, Pages 585-592

  Steimle, R F ^a   Muralidhar, R ^a   Rao, R ^a   Sadd, M ^a   Swift, C T ^a   Yater, J ^a   Hradsky, B ^a   Straub, S ^a   Gasquet, H ^a   Vishnubhotla, L ^a   Prinz, E J ^a   Merchant, T ^a   Acred, B ^a   Chang, K ^a   White Jr , B E ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; EMBEDDED SYSTEMS; NANOCRYSTALS; SEMICONDUCTING SILICON; VOLTAGE CONTROL;

EMBEDDED MEMORY SCALING; NON-VOLATILE MEMORY (NVM); SILICON NANOCRYSTAL MEMORY; TUNNEL OXIDES;

DATA STORAGE EQUIPMENT;

EID: 34247144554     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.01.047     Document Type: Article

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