Statistical constraints in nanocrystal memory scaling

Microelectronic Engineering

Volumn 84, Issue 12, 2007, Pages 2869-2874

  Gusmeroli, Riccardo ^a   Compagnoni, Christian Monzio ^a   Spinelli, Alessandro S ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

Flash memories; Microelectronic scaling; Nanocrystal memories; Semiconductor device modeling

Indexed keywords

COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; FLASH MEMORY; LEAKAGE CURRENTS; MICROELECTRONICS; MONTE CARLO METHODS; PROBABILITY DISTRIBUTIONS; SEMICONDUCTOR DEVICE MODELS; THRESHOLD VOLTAGE;

MICROELECTRONIC SCALING; NANOCRYSTAL MEMORIES; SEMICONDUCTOR DEVICE MODELING;

NANOCRYSTALS;

EID: 36148973552     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2007.02.009     Document Type: Article

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