ELDRS in bipolar linear circuits: A review

IEEE Transactions on Nuclear Science

Volumn 56, Issue 4, 2009, Pages 1894-1908

  Pease, Ronald L ^a   Schrimpf, Ronald D ^b   Fleetwood, Daniel M ^b  

^a RLP Research   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

Accelerated testing; Bipolar linear circuits; Dose rate effects; Enhanced low dose rate sensitivity; Hardness assurance; Low dose rate enhancement factor; Total dose

Indexed keywords

ACCELERATED TESTING; BIPOLAR LINEAR CIRCUITS; DOSE RATE EFFECTS; ENHANCED LOW DOSE RATE SENSITIVITY; HARDNESS ASSURANCE; LOW DOSE RATE ENHANCEMENT FACTOR; TOTAL DOSE;

DOSIMETRY; HARDNESS; HYDROGEN; INDUSTRIAL RESEARCH; IONIZING RADIATION; PASSIVATION; TESTING;

HARDNESS TESTING;

EID: 69549115227     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2011485     Document Type: Conference Paper

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