Mechanisms for total dose sensitivity to preirradiation thermal stress in bipolar linear microcircuits

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 PART 3, 1998, Pages 1425-1430

  Pease, Ronald L ^a  

^a RLP Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; CMOS INTEGRATED CIRCUITS; DOSIMETRY; GATES (TRANSISTOR); INTERFACES (MATERIALS); IRRADIATION; MOSFET DEVICES; THERMAL STRESS;

BIPOLAR LINEAR MICROCIRCUITS; CHARGE DENSITY; PREIRRADIATION THERMAL STRESS; TOTAL DOSE SENSITIVITY;

RADIATION EFFECTS;

EID: 0032100014     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685218     Document Type: Article

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