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Volumn 47, Issue 6 III, 2000, Pages 2350-2357
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Evaluation of accelerated total dose testing of linear bipolar circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
BIPOLAR INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
DEGRADATION;
DOSIMETRY;
ELECTRIC CURRENTS;
INTEGRATED CIRCUIT TESTING;
IRRADIATION;
LINEAR INTEGRATED CIRCUITS;
THERMAL EFFECTS;
ACCELERATED TOTAL DOSE TESTING;
BIAS CURRENT;
DOSE RATE;
LINEAR BIPOLAR CIRCUITS;
RADIATION EFFECTS;
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EID: 0034451416
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/23.903776 Document Type: Conference Paper |
Times cited : (42)
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References (12)
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