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Volumn 47, Issue 6 III, 2000, Pages 2350-2357

Evaluation of accelerated total dose testing of linear bipolar circuits

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; COMPUTER SIMULATION; DEGRADATION; DOSIMETRY; ELECTRIC CURRENTS; INTEGRATED CIRCUIT TESTING; IRRADIATION; LINEAR INTEGRATED CIRCUITS; THERMAL EFFECTS;

EID: 0034451416     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903776     Document Type: Conference Paper
Times cited : (42)

References (12)
  • 5
    • 0032314296 scopus 로고    scopus 로고
    • First observation of enhanced low dose rate sensitivity (ELDRS) in space: One part of the MTPB experiment
    • (1998) IEEE Trans. Nucl. Sci. , vol.45 , pp. 2673
    • Titus, J.L.1
  • 11
    • 0031367388 scopus 로고    scopus 로고
    • A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
    • (1997) IEEE Trans. Nucl. Sci. , vol.44 , pp. 1981
    • Pease, R.L.1
  • 12
    • 0032313729 scopus 로고    scopus 로고
    • Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)
    • (1998) IEEE Trans. Nucl. Sci. , vol.45 , pp. 2665
    • Pease, R.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.