The effects of hydrogen in hermetically sealed packages on the total dose and dose rate response of bipolar linear circuits

IEEE Transactions on Nuclear Science

Volumn 54, Issue 6, 2007, Pages 2168-2173

  Pease, Ronald L ^a,b   Platteter, Dale G ^a,c,d   Dunham, Gary W ^a,c   Seiler, John E ^a,c   Adell, Philippe C ^a,e   Barnaby, Hush J ^a,f   Chen, Jie ^a,f  

^a IEEE   (United States)

^b RLP Research   (United States)

^c NAVAL SURFACE WARFARE CENTER   (United States)

^d Jet Propulsion Laboratory ^*

^e CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^f ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Dose rate; Enhanced low dose rate sensitivity; Hydrogen; Interface traps; Radiation effects; Temperature transducer; Total ionizing dose; Voltage comparator

Indexed keywords

DOSE RATE; INTERFACE TRAPS; TEMPERATURE TRANSDUCERS;

CIRCUIT THEORY; COMPARATOR CIRCUITS; MICROELECTRONICS; OXIDES; RADIATION EFFECTS; SILICON NITRIDE; TRANSISTORS;

HYDROGEN;

EID: 37248999401     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.907870     Document Type: Conference Paper

References (14)

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