Effect of passivation on the enhanced low dose rate sensitivity of national LM124 operational amplifiers

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2004, Pages 42-46

  Seiler, John E ^a   Pease, Ronald L ^b   Platteter, Dale G ^a   Maher, Mike C ^c   Dunham, Gary W ^a   Shaneyfelt, Marty R ^d  

^a NAVAL SURFACE WARFARE CENTER   (United States)

^b RLP Research   (United States)

^c NATIONAL SEMICONDUCTOR CORPORATION   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Dose rate enhancment factor; ELDRS; Enhanced low dose rate sentitivity; Hydrogen; LM124; Nitride; Operational amplifier; Passivation; Secondary ion mass spectrometer; SIMS; Total dose irradiation

Indexed keywords

DOSIMETRY; ELECTRONIC EQUIPMENT TESTING; FABRICATION; HYDROGEN; INTEGRATED CIRCUITS; IRRADIATION; MASS SPECTROMETERS; NITRIDES; PASSIVATION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS;

DOSE RATE ENHANCEMENT FACTOR; ELDRS; ENHANCED LOW DOSE RATE SENSITIVITY (ELDRS); LM124; SECONDARY ION MASS SPECTROMETERS; TOTAL DOSE IRRADIATION;

OPERATIONAL AMPLIFIERS;

EID: 11044225934     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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