Study of low-dose-rate radiation effects on commercial linear bipolar ICs

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2649-2658

  Freitag, R K ^a   Brown, D B ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; IONIZING RADIATION; IRRADIATION; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; RADIATION DAMAGE;

ACCELERATED TESTS;

BIPOLAR INTEGRATED CIRCUITS;

EID: 0032306684     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736510     Document Type: Article

References (17)

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