Thermal-stress effects of enhanced low dose rate sensitivity in linear bipolar ICs

IEEE Transactions on Nuclear Science

Volumn 47, Issue 6 III, 2000, Pages 2539-2545

  Shaneyfelt, M R ^a,b   Schwank, J R ^a,b   Witczak, S C ^a,b   Fleetwood, D M ^a,c   Pease, R L ^a,d   Winokur, P S ^a,b   Riewe, L C ^b   Hash, G L ^a,b  

^a IEEE   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c VANDERBILT UNIVERSITY   (United States)

^d RLP Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELEVATED-TEMPERATURE STRESS; ENHANCED LOW DOSE RATE SENSITIVITY; LINEAR BIPOLAR CIRCUIT;

DOSIMETRY; HARDNESS TESTING; HIGH TEMPERATURE EFFECTS; IRRADIATION; RADIATION EFFECTS; THERMAL CYCLING; THERMAL STRESS;

LINEAR INTEGRATED CIRCUITS;

EID: 0034451107     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903805     Document Type: Conference Paper

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