An updated data compendium of enhanced low dose rate sensitive (ELDRS) bipolar linear circuits

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 127-133

  Pease, R L ^a   McClure, S ^a   Johnston, A H ^a   Gorelick, J ^a   Turflinger, T L ^a   Gehlhausen, M ^a   Krieg, J ^a   Carriere, T ^a   Shaneyfelt, M ^a  

^a RLP Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DATABASE SYSTEMS; IRRADIATION; RADIATION EFFECTS; SENSITIVITY ANALYSIS; THERMAL EFFECTS;

BIPOLAR LINEAR CIRCUITS; ENHANCEMENT FACTOR (EF);

BIPOLAR INTEGRATED CIRCUITS;

EID: 0035166250     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

1. A compendium of recent total dose data on bipolar linear microcircuits
2. An attempt to define conservative conditions for total dose evaluation of bipolar ICs
3. Degradation of precision reference devices in space environments
4. Comparison of total dose effects on micropower Op-amps: Bipolar and CMOS
5. Enhanced low-dose-rate sensitivity of a low-dropout voltage regulator
6. Study of low-dose-rate effects on commercial linear bipolar ics
7. Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)
8. Enhanced low dose rate sensitivity (ELDRS) in a voltage comparator which only utilizes complementary vertical NPN and PNP transistors
9. Thermal-stress effects and enhanced low dose rate sensitivity in linear bipolar ICs
10. Evaluation of accelerated total dose testing of linear bipolar circuits
11. Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators
12. Investigation of enhanced low dose rate sensitivity (ELDRS) of discrete bipolar transistors
13. Total dose effects in conventional bipolar transistors and linear integrated circuits
14. Elevated temperature irradiation of biploar linear microcircuits
15. Enhanced total dose damage in junction field effect transistors and related linear integrated circuits
16. Enhanced damage in biploar devices at low dose rates: Effects at very low dose rates
17. L/f noise, hydrogen transport, and latent interface-trap buildup in irradiated MOS devices