The effects of hydrogen on the enhanced Low Dose Rate Sensitivity (ELDRS) of bipolar linear circuits

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 3169-3173

  Pease, Ronald L ^a   Adell, Philippe Claude ^b   Rax, Bernard G ^b   Chen, Xiao Jie ^c   Barnaby, Hugh J ^c   Holbert, Keith E ^c   Hjalmarson, Harold P ^d  

^a RLP Research   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Dose rate; Enhanced low dose rate sensitivity; Hydrogen; Interface traps; Radiation effects; Total ionizing dose; Voltage comparator

Indexed keywords

COMPARATORS (OPTICAL); DOSIMETRY; ELECTRON TRAPS; HYDROGEN; IONIZING RADIATION; NONMETALS; RADIATION;

DOSE RATE; ENHANCED LOW-DOSE RATE SENSITIVITY; INTERFACE TRAPS; TOTAL IONIZING DOSE; VOLTAGE COMPARATOR;

RADIATION EFFECTS;

EID: 58849102192     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2006478     Document Type: Conference Paper

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