Effects of reliability screening tests on bipolar integrated circuits during total dose irradiation

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2638-2643

  Barillot, C ^a   Serres, O ^a   Marec, R ^a   Calvel, P ^a  

^a THALES ALENIA SPACE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; RADIATION EFFECTS; RADIATION HARDENING; RELIABILITY;

HIGH TEMPERATURE TRANSVERSE BIAS (HTRB) EFFECTS; RELIABILITY SCREENING TESTS;

BIPOLAR INTEGRATED CIRCUITS;

EID: 0032313951     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736508     Document Type: Article

References (12)

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